532 14 1803 3 10814 document 1803 data.rar application/x-rar 77843e052159972e93b11b645c6c3bd9 MD5 65987 2020-08-10 22:27:35 http://edata.bham.ac.uk/532/2/data.rar 532 2 1 application/x-rar other public cc_by_4

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data archive 169 disk0/00/00/05/32 2020-08-11 10:16:15 2020-08-11 10:25:10 2020-08-11 10:16:15 data_collection show Dong Bo B.Dong@bham.ac.uk 0000-0003-0964-5852 Stockham Mark MPS846@student.bham.ac.uk Chater Philip philip.chater@diamond.ac.uk Slater Peter p.r.slater@bham.ac.uk 0000-0002-6280-7673 Diamond Light Source 10col_ephy X-ray Pair Distribution Function; Garnet Solid-State Electrolyte; Cerium Doping A Bruker D8 X-ray diffractometer (XRD) with a CuKα radiation and linear position sensitive detector was used to collect X-ray diffraction data. Patterns were recorded over the 2θ range 15° to 80° with a 0.02° step size. Structural refinement was carried out with the GSAS suite of Rietveld refinement software using the XRD data. Total scattering data were collected at the I15-1 XPDF beamline at Diamond Light Source, UK. Powdered samples were loaded into borosilicate capillaries (1.5 mm OD, 1.17 mm ID) and spun perpendicular to the beam during data collection to improve powder averaging. Scattering data were collected at an X-ray energy of 76.69 keV using a Perkin Elmer XRD 4343 CT area detector placed ~200 mm from the sample. The 2-D data were corrected for polarization and flat-field, then integrated to 1-D using the DAWN package prior to processed the scattering range 0.7 Å−1 ≤ Q ≤ 25 Å−1 into PDFs using the GudrunX package. A modified Lorch Function (∆1 = 0.05 Å) was applied to suppress spurious low-r features. 2020-08-10 published University of Birmingham 10.25500/edata.bham.00000532 Dataset research-data@contacts.bham.ac.uk School of Chemistry epsrc EP/R024006/1: ICSF Wave 1: GENESIS: Garnet Electrolytes for New Energy Storage Integrated Solutions APC (GEM: Garnet Electrolyte Manufacture 56065). en yes yes yes TRUE First Author Dong Bo B.Dong@bham.ac.uk pub https://doi.org/10.1039/D0DT02112A IsDescribedBy A Bruker D8 X-ray diffractometer (XRD) with a CuKα radiation and linear position sensitive detector was used to collect X-ray diffraction data. Patterns were recorded over the 2θ range 15° to 80° with a 0.02° step size. Structural refinement was carried out with the GSAS suite of Rietveld refinement software using the XRD data. Total scattering data were collected at the I15-1 XPDF beamline at Diamond Light Source, UK. Powdered samples were loaded into borosilicate capillaries (1.5 mm OD, 1.17 mm ID) and spun perpendicular to the beam during data collection to improve powder averaging. Scattering data were collected at an X-ray energy of 76.69 keV using a Perkin Elmer XRD 4343 CT area detector placed ~200 mm from the sample. The 2-D data were corrected for polarization and flat-field, then integrated to 1-D using the DAWN package prior to processed the scattering range 0.7 Å−1 ≤ Q ≤ 25 Å−1 into PDFs using the GudrunX package. A modified Lorch Function (∆1 = 0.05 Å) was applied to suppress spurious low-r features. en 2019-03-01 2020-07-15